Latchup Detection and Protection (LDAP-IC)

ZES’ LDAP IC, ZES100 is an integrated solution designed to detect major Single-Event Latchup (SEL) and μ-SEL in target devices (MCU/FPGA/ASIC) and subsequently provide a recovery (Power-cycling). It can be used to protect power supply and Commercial-Off-The-Shelf (COTS) devices from anomalous current due to SEL in Space applications.

Summary

• Fast response to SEL
• Detection of the SEL occurrence at on-set
• Detection of µ-SEL
• Automatic and adjustable power-cycling
• Immune from current drift due to aging and TID
• Wide-range supply voltage and load current
• Space qualified technology
• Radiation Hardened by Design (RHBD)
• Qualified for Space Enhanced Plastic (SEP)

Target Applications

• Protection of MCU/ FPGA/ ASIC
• Protection of Sensors, Camera, etc.,

• Protection for COTS FPGAs, microcontrollers, and other complex ICs in space
• Enabling use of advanced, non-radiation-hardened components in satellite systems
• Critical subsystem protection in CubeSats and larger spacecraft

The ZES LDAP is your key to unlocking the full potential of COTS components in space, offering unmatched protection against the subtle yet potentially catastrophic effects of radiation-induced latchups.

Key Features & Benefits

• • Exceptional micro-SEL detection capability (as low as 1.75x nominal current)
• • Ultra-fast response time (8μs) to prevent component damage
• • Intelligent discrimination between latchup events and normal current fluctuations
• • Dual-level protection for both micro-SELs and major current anomalies
• • Radiation-hardened design (TID > 300 krad, SEE > 110 MeV-cm²/mg)
• • Flexible integration options for various COTS components and system architectures

How it works

The ZES LDAP continuously monitors current drawn by protected COTS components:

1. Detects micro-SELs that conventional current limiters miss
2. Rapidly initiates power cycling to clear latchup conditions
3. Provides telemetry data for system health monitoring