Zero-Error Systems (ZES) Unveils Industry-First Radiation-Hardened ‘Smart Latching Current Limiter’(Smart LCL-IC) ZES744LCL (60V/4A)/ ZES723LCL (28V/4A) Using Proprietary RHBD Technology at Space Summit 2026, Singapore.
Monday, 2nd February 2026, Singapore
Zero-Error Systems (ZES) is excited to announce the launch of the Smart-LCL (ZES744/ ZES723), the industry’s first radiation-hardened Smart Latch-up Current Limiter (Smart-LCL) explicitly designed using Radiation Hardened by Design (RHBD) proprietary patented technology for advanced satellite applications. This cutting-edge high-voltage Smart-LCL device features groundbreaking technology with a wide input voltage range of 4V to 60V, and a robust built-in power MOSFET capable of handling up to 4A of current, and >4A expandable using external MOSFET in a compact QFN48L Space Enhanced Plastic (SEP) package. The Smart-LCL has unique smart-monitoring functions that actively detect and respond to over-current events, providing essential protection to next-generation satellite systems in space, and complies to ECSS-E-ST-20-20C standards.
The ZES744/ ZES723 are designed and manufactured using ZES’ patented proprietary RHBD technology, which offers superior radiation tolerance compared to traditional ceramic packaged products. This cost-effective Smart-LCL is specifically designed to withstand the harsh radiation environments of space, ensuring reliable performance over extended mission lifetimes, protecting the valuable space electronic systems.
As the demand for satellite-based edge-computing, artificial intelligence (AI), and data centers in space grows exponentially, the Smart-LCL addresses a critical need in protection of space electronics. With the rise of high-performance processors, including GPUs and NPUs, onboard satellite systems face increased vulnerability to latch-up conditions caused by radiation induced SEL (Single Event Latchup) and over-current surges.
What makes ZES’ Smart-LCL unique?
The ZES744/ ZES723 Smart-LCL offers unique capabilities designed to protect space-based electronics from over-current damage, leading to system failures.
The Smart-LCL shields these high-value electronic systems from potential damage and ensures their longevity by isolating power lines during catastrophic SEL events. This innovation is crucial in protecting the sophisticated payloads driving today’s advanced space missions, making the ZES744/ ZES723 series an indispensable tool for future satellite constellations.
The Smart-LCL IC operates with a very low quiescent current of just 2mA (typ.) and boasts a fast trip-off time of 4.5ms. Housed in a compact QFN48L Space Enhanced Plastic (SEP) package (9mm x 9mm), it provides an efficient solution for space missions where size and performance are critical. ZES’s Smart-LCL IC is designed based on ECSS-E-ST-20-20C, offering an unprecedented means in current limiter switching of the power supply lines. Specifically, ZES’s Smart-LCL embodies a unique Smart-monitor with two types of operations: Latched or Re-triggerable, with built-in smart current limitation for repetitive overloads, with embedded current sense and Digital status for system monitoring. Further, to enable design flexibility the LCL offers configurable trip-off and recovery times, configurable undervoltage protection, and floating ground.
ZES’ Smart-LCL can also be used together with ZES100 LDAP-IC (Latch-up Detection and Protection), to provide comprehensive protection against a wide range of current faults, including Single Event Latch-up (SEL) and micro-SEL currents, effectively detecting and safeguarding commercially-off-the-shelf (COTS) devices from these potentially damaging radiation events.
The target market for this ‘Smart-LCL’ products includes satellite Power Distribution Units (PDU), Satellite’ Electrical Power System (EPS), On-Board Computers (OBC), and a wide range of payload subsystems such as GPS, ADCS, telemetry systems, camera image sensors, SAR communication modules, and more.
Rajan Rajgopal, CEO at ZES, says, “We are thrilled to introduce our high-voltage Smart-LCL series (ZES744/ ZES723), specifically designed for the rigorous demands of space applications. As the first of its kind in the market, this product reflects our unwavering commitment to pushing the boundaries of innovation and delivering cutting-edge solutions that enable our customers to protect their COTS components in Space.
Contact ZES for more information, order samples, or schedule a product demo. Visit ZES booth (#E02) at Space Summit 2026, Singapore on February 2nd-3rd, 2026.
About ZES
Zero-Error Systems (ZES) specialises in high-reliability semiconductor solutions and intellectual properties (IP) for Space and Power management applications. Singapore-based ZES has established patented radiation-hardened semiconductor integrated circuits technologies that enable protection of low-cost commercial-off-the-shelves (COTS) devices for Space applications by ascertaining power-reliability and data-integrity. ZES effectively addresses the growing demand for radiation protection semiconductors especially for power-reliability, and data-integrity solutions specifically designed for Low Earth Orbit (LEO) satellites, deep space rovers and landers, and a wide array of Power management solutions for AI-Data centers applications on Earth.
ZES wide range of Rad.-Hardened products lineup includes, LDAP-IC (Latchup Detection and Protection), TMR Voter-IC for SEU mitigation, Point-of-Load (PoL) DC/DC converter, Smart-LCL(60V, 28V/ 4A), Rad.-Tolerant System-on-Modules (ZSOMTM) with FPGA (AMDTM MPSoC) and MCU (ARMTM Cortex M0+) and TMR Voter-module. ZES Power Management solutions includes, 48V to 0.xV single-step DC/DC conversion for GPU-power delivery for terrestrial AI-Data centers applications.
Media Contact: sales@zero-errorsystems.com
