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- Radiation Hardened: By Process vs. By Design
- Micro-SEL Detection: Key to Protecting COTS
- 4 Principles of Rad-Hard Power Management
- Data Integrity Preservation
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Products
Space: Rad. Hard. ICs
LDAP – Latchup Detector & Protector
PoL – Point of Load
TMR Voter-IC/EDAC Algorithm
Space: Rad. Tol. Modules
ZSOM-M01: System on Module (MCU)
ZSOM-F01: System on Module (FPGA)
ZM-VF01A: ZEDAC Voter module
Commercial ICs
DC/DC Converter
IP Licensing & Design Services
Radiation Hardened By Desing (RHBD)
IP Library Cells Licensing (Digital)
Irradiation Test & Advisory Services
Laser Diagnostic Test & Advisory
Heavy-ion Diagnostic Test & Advisory
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Space Legacy
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Corporate
About Us
Our History
Leadership
Quality Service
Careers
Technologies
- Radiation Hardened: By Process vs. By Design
- Micro-SEL Detection: Key to Protecting COTS
- 4 Principles of Rad-Hard Power Management
- Data Integrity Preservation
Products & Services
- Products
-- Space: Rad. Hard. ICs
LDAP – Latchup Detector & Protector
PoL – Point of Load
TMR Voter-IC/EDAC Algorithm
-- Space: Rad. Tol. Modules
ZSOM-M01: System-on-Module (MCU)
-- Commercial ICs
DC/DC Converter
- IP Licensing & Design Services
IP Library Cells Licensing (Digital)
- Irradiation Test & Advisory Services
Laser Diagnostic Test & Advisory
Heavy-ion Diagnostic Test & Advisory
Resources
Sales T&C
Purchase T&C
Application notes
Test reports
News
Space Legacy
Investor Relations
Contact Us
Hi-Reliability Semiconductors for Power & Data management
Hi-Efficiency DC/DC for Power Management
Protecting COTS devices in SPACE
Contributing Towards a Sustainable Ecosystem in Space by Enabling the Use of COTS
Ensuring POWER RELIABLITY and DATA INTEGRITY in Radiation-Affected Environments
Space Legacy
Products & Services
IP Licensing & Design Services
Rad. Hard By Design (RHBD)
Components/Modules
Space
LDAP
Point of Load (PoL) IC
ZSoM™-Module
Commercial
DC/DC Converter
Data Integrity – Space
Voter IC
Irradiation/Laser Diagnostic Test & Advisory
Heavy-ion Diagnostic Test & Advisory
Laser Diagnostic Test & Advisory
Contact Us
Significant Solar Storm Anticipated in 2025
Solar Storm
Solar storms pose a significant threat to electronic devices. ZES’ solutions are critical for protecting your COTS components from damage by radiation-induced SEE (micro-SEL/SEL, SEU/SET)
Technologies
1) Radiation Hardened: By Process vs. By Design
2) Micro-SEL Detection: Key to Protecting COTS
3) 4 Principles of Rad-Hard Power Management
4) Data Integrity Preservation
ZES IN THE
NEWS
News
05
March
2025
A single microelectronic glitch can jeopardize an entire space mission
News
27
February
2025
ZES Debuts Radiation Tolerant System-on Module for Space
News
26
February
2025
Zero-Error Systems Launches Industry’s First COTS FPGA-Based Radiation-Tolerant System-on- Module for Space Applications
News
